By Donald E. Leyden (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki (eds.)
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Extra resources for Advances in X-Ray Analysis: Volume 30
33, Nippon Mining, K. Nakamoto et al. 8. Determination of Pb, Bi and H2 SiF 6 (Bi or Pb) Using Dropping Techniques on Filter Paper (1984) No. 34, Mitsui Metal and Mining, N. Kitamura et a1. e) Semiconductor The film technologies related to electronic and optical devices in the field of semiconductor and magnetic disk memory industry have made remarkable progess. A variety of layered material thickness in multi -,layered structure of LSI and memory devices is in the range of 100A to 2~m. 2-JA. It is generally said that the soft and ultrasoft X-ray method should be applied to measure the thickness and composition of layered materials on silicon wafers and other substrates.
3, No. 2 (1984) 162 3. , Fenxi Huaxue, Vol. 8 (1984) 749 4. , Fenxi Huaxue, Vol. 11, No. 10 (1983) 750 5. , Fenxi Huaxue, Vol. 12, No. 5 (1984) 384 6. , Analytical Laboratory, Vol. 5, No. 1 (1986) 57 25 TOMOYAARAI h) Matrix Effects and Corrections For the study of matrix correction, the a correction method has been studied and Dr. Lachance's book was translated into the Chinese language. They have compared the theoretical tion of matrix effects. e~pirical approach for the correc- 1. Theoretical Analysis of the Empirical Coefficient Methods for XRF, Wang Yongzhong, Acta Physica Sinica, Vol.
Yoshika et al. 6. Relation Between X-ray Intensity and Content of Ore and Intermediate Materials in the Smelting Process (1983) No. 33, Sumitomo Metal and Mining, M. Kyomoto et al. 7. XRF in Mikkaichi Zinc Smelting Works (1983) No. 33, Nippon Mining, K. Nakamoto et al. 8. Determination of Pb, Bi and H2 SiF 6 (Bi or Pb) Using Dropping Techniques on Filter Paper (1984) No. 34, Mitsui Metal and Mining, N. Kitamura et a1. e) Semiconductor The film technologies related to electronic and optical devices in the field of semiconductor and magnetic disk memory industry have made remarkable progess.
Advances in X-Ray Analysis: Volume 30 by Donald E. Leyden (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki (eds.)