By Earl J. Kirkland
Advanced Computing in Electron Microscopy, second version, brings jointly varied details on picture simulation. a useful source, this publication offers details on quite a few tools for numerical computation of excessive answer traditional and scanning transmission electron microscope photographs. this article is going to function a useful gizmo for college students on the complicated undergraduate or graduate point, in addition to skilled researchers within the box.
This greater moment version contains:
-descriptions of latest advancements within the field
-additional fabric on aberration corrected tools and confocal electron microscopy
-expanded and enhanced examples and sections to supply superior clarity
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Additional info for Advanced Computing in Electron Microscopy
This produces the smallest tails but increases the FWHM (minimum rms radius approx. 43(Cs λ 3 )1/4 ) to about twice that of the probe with Scherzer conditions. Scherzer conditions seem to be a compromise between a small full width half maximum and large tails. Mory et al.  have 54 3 Linear Image Approximations also considered the optimum probe defocus for STEM imaging and microanalysis. Intaraprasonk et al.  have discussed optimizing the probe with spherical aberration through fifth order.
A focused probe is calculated by integrating the aberration wave function exp[−iχ (k)] over the objective aperture with translation to a particular point in the image. 9 shows the relative placement of the wave functions in the STEM column. 59) where λ kmax = αmax is the maximum angle in the objective aperture and A p is a normalization constant chosen to yield; |ψ p (x, x p )|2 d2 x = 1. 60) With this normalization the total incident intensity in the electron probe is also unity (alternately the probe integral could be scaled to yield the actual value of the beam current in some appropriate choice of units).
All images are of a 200 keV probe (or self luminous point) ˚ (b) defocus of 100 A, ˚ (c) twofold astigmawith a 20 mrad apert. 057 mm 22 2 The Transmission Electron Microscope Fig. 13 Probe shape with combinations of aberrations. 3 mm, an aperture of 10 mrad and (a) defocus of 800A, ˚ and twofold astigmatism of 200A. ˚ The scale bar in (a) is 5 A ˚ defocus of 800A, the optical aberrations of the lens. Scherzer showed theoretically that a static round lens always has a positive spherical aberration.
Advanced Computing in Electron Microscopy by Earl J. Kirkland